Biography – Dr. Robert Baumann

Overview
Robert Baumann received his BA in Physics from Bowdoin College in 1984, where he was awarded the Noel C. Little Prize in Experimental Physics and earned his Ph.D. in ECE from Rice University in 1990.  At Texas Instruments, he discovered the reaction of  10 B with cosmic neutrons in specific IC layers was a dominant risk and developed mitigation that reduced product failure rates ten- fold industry-wide. He was directly responsible for the development of several JEDEC test standards, and for leading an SIA experts panel that convinced the U.S. Government to enact changes in ITAR export controls that ultimately removed the risk of inadvertent restrictions on the U.S. commercial industry. In 2018 he left TI and divided his time between consulting for a variety of aerospace and terrestrial customers, and held a position as an adjunct R&D professor at SMU where he led research on radiation effects in gallium nitride devices. He recently moved to UTD where he is currently building the radiation effects characterization and modeling capabilities of the Center for Harsh Environment Semiconductors and Systems(CHESS). Robert is a TI Fellow (emeritus) and IEEE Fellow has coauthored > 100 papers/presentations, TI’s Radiation Handbook for Electronics, two book chapters, and 17 patents.